# Vault 7: Projects

This publication series is about specific projects related to the Vault 7 main publication.

### Dark Matter

# FDOS v1.0 FINAL - B57 udiag

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Broadcom NetXtreme Ethernet Adapter • Diagnostic User’s Guide
page 24
Broadcom Confidential and Proprietary
3.7.3 F3. Indirect APE Peripheral Register Test
Command: nictest f3
Function: Using indirect addressing method, incremented data is written into APE Peripheral
registers and read back for verification. The memory read/write is done 100 times while
incrementing test data.
Default: Enabled
3.7.4 F4. APE Peripheral Register Test
Command: nictest f4
Function: Each Register specified in the APE Peripheral register block is tested for read
only bits and read/write bits. The test writes zeroes and ones into the test bits to insure the
read only bits are not changed, and read/write bits are changed accordingly.
Default: Enabled
3.7.5 F5. APE Scratch Pad Test
Command: nictest f5
Function: This test tests the APE scratch pad SRAM on the APE enabled NetXtreme
controllers. The following tests are performed:
Data Pattern Test: Write test data into SRAM, read back to ensure data is correct. The test
data used is 0x00000000, 0xffffffff, 0xaa55aa55, and 0x55aa55aa.
Alternate Data Pattern Test: Write test data into SRAM. Write complement test data into
next address. Read back both data to insure the data is correct. After the test, the program
reads back data one more time to insure the data stays correct. The test data used is
0x00000000, 0xffffffff, 0xaa55aa55, and 0x55aa55aa.
Address Test: Write each address with unique increment data. Read back data to insure
data is correct. After filling the entire memory length with the unique data, the program reads
back the data again to insure data stays the same.
Walking Bit Test: For each address location, starting at bit 0, each bit is set, tested and
then shifted left by one. This process is repeated for each of the 32 bits in each address
location in the entire memory test range.
Pseudo Random Data Test: A pre-calculated pseudo random data is used to write a unique
data into each test RAM. After the first pass the test, the program reads back one more time
to insure data stays correct.
Default: Enabled

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