# Vault 7: Projects

This publication series is about specific projects related to the Vault 7 main publication.

### Dark Matter

# FDOS v1.0 FINAL - B57 udiag

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Broadcom NetXtreme Ethernet Adapter • Diagnostic User’s Guide
page 13
Broadcom Confidential and Proprietary
3 Diagnostic Tests
The tests are divided into seven groups: Register Tests, Memory Tests, Miscellaneous Tests, Data
Tests, Cable Tests, APE Register Tests and APE Diagnostics Tests. They numbered as group ‘A’,
‘B’, ‘C’, ‘D’, ‘E’, ‘F’, and ‘G’.
Note: For few special scenairos, not all tests are supported. Refer to online help for more
information.
The lists of each group are shown as below. Their detailed explanation will be described later.
Group A.
A1. Indirect Register Test
A2. Control Register Test
A3. Interrupt Test
A4. BIST
A5. PCI Cfg Register Test
A6. Serial Number Reg Test
A7. Power Register Test
A8. MailBox Register Test
Groupt B.
B1. Scratch Pad Test
B2. BD SRAM Test
B3. DMA SRAM Test
B4. MBUF SRAM Test
B5. MBUF SRAM via DMA Test
B6. External SRAM Test
B7. CPU GPR SRAM Test
Group C.
C1. EEPROM Test
C2. CPU Test
C3. DMA Test
C4. MII Test
C5. VPD Test
C6. ASF Hardware Test
C7. ROM Expansion Test
C8. CPU Fetch Test
Group D.
D1. Mac Loopback Test
D2. Phy Loopback Test
D3. RJ45 Loopback Test
D4. 1G False Carrier Test
D5. MII Miscellaneous Test

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